Building Filters
IN-CIRCUIT TESTER FA1220-11
- Fabricante: HIOKI E.E
Number of test points: Standard: 0 pins (scanner boards optional) Max. 2048 pins (expandable in blocks of 128 pins)* * The maximum number of active pins for each test type depends on the total number of scanner b...
Nagano, JapónSHORT-OPEN TESTER FA1221
- Fabricante: HIOKI E.E
Number of test points: 128 pins (during 4-terminal measurement, up to 32 sets) | Number of test steps: Round-robin short/open : 128 pins Component data : Max. 10000 steps Charge data : 40 sets Pin contact data : ...
Nagano, JapónIN-CIRCUIT TESTER FA1220-02
- Fabricante: HIOKI E.E
Number of test points: Standard: 0 pins (scanner boards optional) Max. 2048 pins (expandable in blocks of 128 pins)* * The maximum number of active pins for each test type depends on the total number of scanner b...
Nagano, JapónFLYING PROBE TESTER FA1240-6x
- Fabricante: HIOKI E.E
Number of arms: 4 (L, ML, MR, R) | Number of test steps: 40,000 (max.) | Measurement ranges: Resistance: 400 μΩ to 40 MΩ Capacitance: 1 pF to 400 mF Inductance: 1 μH to 100 H Diode VZ measurement: 0 to 25 V Zener...
Nagano, JapónIN-CIRCUIT TESTER FA1220
- Fabricante: HIOKI E.E
Number of test points: Max. 1024 pins (Can be added in blocks of 128 pins.) Standard : 0 pins (Scanner boards are sold as options.) | Number of test steps: Round-robin short/open data : 1024 pins Component data :...
Nagano, JapónFLYING PROBE TESTER FA1283
Number of arms: 4 (2 each, top and bottom) | Mountable probes: 1172 series | Number of test steps: Max. 900,000 steps | Measurement parameters and measurement ranges: Resistance : | Judgment range: -99.9% to +999...
Nagano, Japón